Available Technology

Direct detection of x-rays for protein crystallography employing a thick, large area CCD

An apparatus and method for directly determining the crystalline structure of a protein crystal. The crystal is irradiated by a finely collimated x-ray beam. The interaction of the x-ray beam with the crystal produces scattered x-rays. These scattered x-rays are detected by means of a large area, thick CCD which is capable of measuring a significant number of scattered x-rays which impact its surface. The CCD is capable of detecting the position of impact of the scattered x-ray on the surface of the CCD and the quantity of scattered x-rays which impact the same cell or pixel. This data is then processed in real-time and the processed data is outputted to produce a image of the structure of the crystal. If this crystal is a protein the molecular structure of the protein can be determined from the data received.
Inventors: 

Timothy

McKay

Muzaffer

Atac

Patent Number: 
5,978,444
Patent Issue Date: 
November 2, 1999
Region
Midwest
State: 
Illinois
Phone: 
630-840-3000
Email: 
fermilab@fnal.gov
Lab Representatives
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