Materials structure and property characterization facilities

Agency/Department

Security Lab

No

Address

Description

  1. SEM - Scanning electron microscopy: JEOL model 4200 SEM with 5-axis stage, can accommodate specimens up to 25 mm x 25 mm x 6 mm.
  2. EDS - Energy dispersive x-ray spectroscopy: Oxford EDS system for performing chemical analyses.
  3. EBSD - Electron backscattered electron diffraction: Oxford system for detecting crystallographic orientation and deformation.
  4. Laser Confocal Scanning Microscope - Keyence VK9700 microscope system for no-contact analysis of topographical features to 10 nm resolution and angles up to 80 degrees from horizontal over large areas (8 cm x 8 cm).
  5. Stylus Profilometer - measurement of surface roughness and topographical features by contact method over areas up to 1 cm x 1 cm.
  6. FTIR - Fourier transform Infrared spectroscopy(with ATR) : apparatus for identifying the chemical species by bonding energies.
  7. DSC - Differential scanning calorimeter: apparatus for analyzing thermodynamics and kinetics of phase reactions in materials .
  8. TGA - Thermogravimetric analysis : apparatus for analyzing chemical reactions due to mass changes and release of gaseous by-products.
  9. Mechanical Property Testing Facility - Equipment is available for tensile testing according to ASTM E-8 for up to 30 cm length and 1 cm 2 cross-section. Wire pieces and composite samples can also be accommodated. Hardness measurements of centimeter-scale samples, and portable hardness measurement of large pieces. Bend and impact testing to 10 mm thickness.
No Available Technologies for this lab
No Funding for this lab
No Programs for this lab
No Facilities for this lab
No Equipment for this lab
No publications for this lab
No awards for this lab
No news for this lab
Submit an Article
No Notices for this lab
No success stories for this lab
Submit an Success Story