Atomic Force Microscope 1: Veeco Dimension 3100

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Description

Description:

CORAL Name: AFM 1

A tool used to characterize the material surface, nanostructures generated by nanofabrication, nanomanipulation, and nanolithography. The tool can take samples up to 200mm in diameter and 12mm in thickness.

Specifications / Capabilities:
  • Contact mode, Tapping mode TM, Phase imaging TM
  • Electrostatic force microscopy
  • Magnetic force microscopy
  • Nanomanipulation and nanolithography
Scientific Opportunities / Applications:
  • Surface characterization for thin films
  • Pattern characterization for lithography structures, magnetic media, CD/DVDs
  • Biomaterials, optics and other samples
  • Nanomanipulation and nanolithography using AFM tip
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